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8–13 Oct 2012
US/Pacific timezone

PD/P8-18: Study on TAE-Induced Fast-Ion Loss Process in LHD

12 Oct 2012, 14:00
4h 45m
Poster Room (Area F-B)

Poster Room (Area F-B)

Poster PD - Post Deadline Poster: P8

Speaker

Mr Kunihiro Ogawa (Japan)

Description

Characteristics of fast-ion losses induced by toroidal- lfvén eigenmode (TAE) have been investigated over wide parameter ranges of the Large Helical Device (LHD) plasmas to reveal the fast-ion loss process. To study fast-ion losses, a scintillator-based lost-fast ion probe (SLIP) is used, and an increment of fast-ion loss flux due to the TAEs from the neoclassical orbit loss level (Delta Gamma (fast ion)) is measured. It is newly found that the dependence of fast-ion loss flux on TAE magnetic fluctuation amplitudes changes at a certain fluctuation level. Experimental results show that in the low TAE magnetic fluctuation amplitude (b_theta TAE) regime, Delta Gamma (fast ion) is proportional to b_theta TAE whereas Delta Gamma (fast ion) increases with the square of b_theta TAE in the higher b_theta TAE regime. Simulation by orbit following codes that incorporates magnetic fluctuations with frequency chirping down due to TAEs suggests the change of the fast-ion loss process from a convective (Delta Gamma fast ion proportional to b_theta TAE) to a diffusive (Delta Gamma fast ion proportional to b_theta TAE ^2) character as b_theta TAE increases.

Country or International Organization of Primary Author

Japan

Primary author

Mr Kunihiro Ogawa (Japan)

Presentation materials