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27–30 Jan 2025
IAEA Headquarters, Vienna
Europe/Vienna timezone

Charge Radii of Nuclei by EUV and X-ray Spectroscopy of Highly Charged Ions

29 Jan 2025, 11:30
45m
Room C0343 (IAEA Headquarters, Vienna)

Room C0343

IAEA Headquarters, Vienna

Vienna International Center Wagramerstrasse 5 U-Bahn U1 Kaisermuhlen

Speaker

Endre Takacs (Clemson University)

Description

Electron beam ion traps (EBITs) have proven to be a valuable tool for the spectroscopy of highly charged ions over the past few decades. Na-like and Mg-like ions are especially interesting in the context of nuclear charge radii sensitivity due to the enhanced overlap of their ground-state wave functions with the nucleus. Their strong 3s–3p emission can be measured with high precision experimentally in the extreme ultraviolet and x-ray spectral ranges. A careful assessment of the uncertainties in advanced atomic structure calculations makes these measurements competitive with standard nuclear charge radii determination techniques. We report on this method for determining the absolute nuclear charge radius of medium to high atomic number elements. The measurement utilizes only a few million ions stored in an ion trap, which is advantageous for measurements involving small quantities of sample nuclei. Preparations are underway to apply the technique to radioactive nuclei.

This work is funded by a NIST grant (Award Number 70NANB20H87) and by a National Science Foundation grant (Award Number 2309273).

Primary author

Endre Takacs (Clemson University)

Co-authors

Hunter Staiger (Clemson University) Prof. Steven Blundell (University of Grenoble Alpes) Prof. Dipti (Clemson University) Prof. Gerald Gwinner (University of Manitoba) Prof. Roshani Silwal (Appalachian State University) Dr Alain Lapierre (Facility for Rare Isotope Beams) Dr John Gillaspy (National Science Foundation) Dr Galen O’Neil (National Institute of Standards and Technology) Dr Joseph Tan (National Institute of Standards and Technology) Yuri Ralchenko (National Institute of Standards and Technology)

Presentation materials