Speaker
Description
A real-time signal processing unit based on FPGA has been developed for electron temperature (Te) evaluation in a Thomson scattering (TS) diagnostic system. The FPGA module is independent of the polychromator and is integrated with ADC and DAC components as a compact real-time processing unit. It receives five analog input channels directly from the spectral outputs of the polychromator and digitizes scattered signal pulses (~40 ns width) using a 16-bit, 1 GS/s ADC.
After background subtraction, each channel’s waveform is integrated, consuming 1.01 μs in simulation. The resulting integrals are then standardized across the five channels, a process taking 4.26 μs. These standardized values are matched against a precomputed 5001×5 spectral response database using a minimum-variance search algorithm. The database lookup takes 12.4605 μs in simulation, yielding the Te estimate. A 16-bit DAC converts the result to a 0–10 V analog voltage, linearly corresponding to 1–5000 eV. Preliminary validation has been performed for Te; the electron density (ne) algorithm is under development. The system demonstrates sub-15 μs processing latency and provides a viable foundation for future real-time plasma diagnostics and control applications.
| Speaker's email address | zhaiwenyan@swip.ac.cn |
|---|---|
| Speaker's Affiliation | Southwestern Institute of Physics |
| Member State or International Organizations | China |
