Speaker
Description
Over the last years, Bayesian Analysis became a standard method in plasma physics for a common plasma parameter profile determination and mathematical correct error analysis [1-3], evaluating data measured by various diagnostics.
This paper gives an overview of established as well as recently deployed physics models within the Minerva Bayesian analysis framework [2] for a wide range of different diagnostics operated at Wendelstein 7-X, such as two X-ray imaging spectrometers (XICS) [4], a charge exchange recombination spectroscopy diagnostic (CXRS) [5], an X-ray tomography system (XMCTS) [6,7], a Thomson scattering (TS) [8], an electron cyclotron emission (ECE) [9], and an effective charge measurement (Zeff) [10] diagnostic.
Upon individual examples, benchmarking of evaluated plasma parameters in cross comparison for different diagnostics, e.g. Te , Ti , and nAr observed with XICS, CXRS, and TS will be discussed as well as prospects for the application of artificial neural networks for fast data analysis of complex physics models.
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Country or International Organisation | Germany |
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Affiliation | Max-Planck-Institute for Plasma Physics |